The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2010

Filed:

Apr. 29, 2005
Applicants:

Wong Su Wei, Singapore, SG;

Victor Vertoprakhov, NovosiBirsk, RU;

Zhou Wensen, Singapore, SG;

Noor Ashedah Binti Jusoh, Singapore, SG;

Tian Poh Yew, Singapore, SG;

Ah Kow Chin, Johor, MY;

Chee Leong Chua, Singapore, SG;

Inventors:

Wong Su Wei, Singapore, SG;

Victor Vertoprakhov, NovosiBirsk, RU;

Zhou Wensen, Singapore, SG;

Noor Ashedah Binti Jusoh, Singapore, SG;

Tian Poh Yew, Singapore, SG;

Ah Kow Chin, Johor, MY;

Chee Leong Chua, Singapore, SG;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01N 21/00 (2006.01); H04N 9/47 (2006.01); H04N 7/18 (2006.01); G06K 9/00 (2006.01); B07C 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of optically inspecting a fastener to determine whether it meets two or more dimensional parameters is provided. The method includes using centrifugal force to place the fastener in a predetermined location. Two or more sets of image data of the fastener are generated from two or more corresponding different angles. Fastener pass/fail data is generated using a dimensional requirement associated with each set of image data.


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