The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2010

Filed:

Jul. 18, 2008
Applicants:

Bincheng LI, Sichuan, CN;

Yuan Gong, Sichuan, CN;

Inventors:

Bincheng Li, Sichuan, CN;

Yuan Gong, Sichuan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

A cavity ring-down apparatus and method is provided for measuring the reflectivity of highly reflective mirrors. The apparatus comprises an optical ring-down cavity including three highly-reflective mirrors whose frequency-selective optical transmission is retro-reflected into the oscillator cavity of a continuous-wave semiconductor laser, creating a change of output spectrum of said laser and enhancing the coupling coefficient of the laser power into the optical ring-down cavity. The drive current/voltage of the semiconductor laser is modulated by a square-wave function output by a function generation card. Thus the laser beam is suddenly switched off at the negative step of the square-wave signal periodically. Immediately after switching off the laser beam, an exponential decay signal of the ring-down cavity is measured by a photo detector and used to determine the decay time of the cavity and the reflectivity of highly reflective mirrors.


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