The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Mar. 14, 2008
Chii-wann Lin, Taipei, TW;
Jheng-long Lee, Taipei, TW;
Rong-huay Juang, Taipei, TW;
Shi-ming Lin, Taipei, TW;
Chih-kung Lee, Taipei, TW;
Rea-min Chu, Taipei, TW;
Ching-ho Wang, Taipei, TW;
Jim-min Fang, Taipei, TW;
Tsung-liang Chuang, Taipei, TW;
Chii-Wann Lin, Taipei, TW;
Jheng-Long Lee, Taipei, TW;
Rong-Huay Juang, Taipei, TW;
Shi-Ming Lin, Taipei, TW;
Chih-Kung Lee, Taipei, TW;
Rea-Min Chu, Taipei, TW;
Ching-Ho Wang, Taipei, TW;
Jim-Min Fang, Taipei, TW;
Tsung-Liang Chuang, Taipei, TW;
Council of Agriculture, Executive Yuan, Taipei, TW;
Abstract
An optical waveguide SPR sensor is adapted for differential measurement. The optical waveguide SPR sensor includes a base, a bottom layer, and at least one set of optical waveguide layers. The set of the optical waveguide layers includes a measuring optical waveguide channel and a reference optical waveguide channel. The measuring optical waveguide channel includes an SPR sensing film layer. The measuring optical waveguide channel and the reference optical waveguide channel are independently configured and substantially parallel one to another. The bottom layer has a refractive index higher than a refractive index of the optical waveguide layer.