The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Dec. 04, 2007
Mieko Yamagaki, Tokyo, JP;
Yu Mimura, Tokyo, JP;
Kazuyou Mizuno, Tokyo, JP;
Takeshi Takagi, Tokyo, JP;
Mieko Yamagaki, Tokyo, JP;
Yu Mimura, Tokyo, JP;
Kazuyou Mizuno, Tokyo, JP;
Takeshi Takagi, Tokyo, JP;
The Furukawa Electric Co., Ltd., Tokyo, JP;
Abstract
The invention provides a Stokes parameter measurement device and Stokes parameter measurement method that enable high-precision measurement. The Stokes parameter measurement device comprises a polarization splitting device which comprises an optical element formed of a birefringent crystal material and which, by means of the optical element, splits signal light to be measured into a plurality of polarized light beams and adjusts the polarization state of one or more among the plurality of polarized light beams, and a light-receiving portion for performing photoelectric conversion of an optical component of the signal light split by and emitted from the polarization splitting device.