The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Dec. 29, 2008
Euo Chang Jung, Daejeon, KR;
Hye-ryun Cho, Daejeon, KR;
Kyoung Kyun Park, Daejeon, KR;
Jei-won Yeon, Daejeon, KR;
Kyuseok Song, Daejeon, KR;
Euo Chang Jung, Daejeon, KR;
Hye-Ryun Cho, Daejeon, KR;
Kyoung Kyun Park, Daejeon, KR;
Jei-Won Yeon, Daejeon, KR;
Kyuseok Song, Daejeon, KR;
Korea Atomic Energy Research Institute, Daejeon, KR;
Abstract
The present invention relates to an apparatus and method for measuring the size of nanoparticles present in an aqueous solution as an infinitesimal quantity, and, more particularly, to a scheme that remotely measures the laser-induced breakdown of a fine nanoparticle using a probe beam in a non-contact manner, performs curve fitting on the symmetrical frequency distribution curve of the measured magnitude of a probe beam signal to form the shape of a Gaussian function, obtains calibration curves for the size of the nanoparticle from the peak and full-width at half-maximum thereof, and determines the size of an unknown nanoparticle from the calibration curves.