The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2010

Filed:

Dec. 27, 2004
Applicants:

Katsutoshi Nonaka, Hamamatsu, JP;

Takeo Sugawara, Hamamatsu, JP;

Inventors:

Katsutoshi Nonaka, Hamamatsu, JP;

Takeo Sugawara, Hamamatsu, JP;

Assignee:

Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G02B 6/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a fiber optic blockformed by bundling and integrating a plurality of optical fiberseach composed of a core regionand a clad region, an at least partially curved input end facecomposed of one end of each optical fiber and a measurement surface having a curved surface shape of a to-be-measured object are pressed against each other. Then, an optical image formed by bringing the input end face into contact with the measurement surface and output from an output end faceof the fiber optic block is used to inspect the curved surface shape of the to-be-measured object. This allows a curved surface shape inspection method capable of inspecting the shape of a curved surface easily, a fiber optic block, and a curved surface shape inspection apparatus to be achieved.


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