The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Jan. 11, 2008
Dayou Wang, Jefferson Station, NY (US);
Ming Yu, South Setauket, NY (US);
Dayou Wang, Jefferson Station, NY (US);
Ming Yu, South Setauket, NY (US);
Symbol Technologies, Inc., Holtsville, NY (US);
Abstract
A target distance to a system target located at variable distances from an imaging system is determined by illuminating a calibration target at a calibration distance with a collimated light beam during a calibration mode of operation, by illuminating the system target at the variable target distance with the collimated light beam during an imaging mode of operation, by configuring the collimated light beam with a beam spot of a generally constant size during both modes of operation, by capturing return light of a calibration image size from the calibration target during the calibration mode, by capturing return light of a target image size from the system target during the imaging mode, and by determining the variable target distance based on the calibration distance, the calibration image size, and the target image size.