The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Sep. 25, 2007
Bradley B. Schneider, Bradford, CA;
Thomas R. Covey, Richmond Hill, CA;
Bradley B. Schneider, Bradford, CA;
Thomas R. Covey, Richmond Hill, CA;
MDS Analytical Technologies, A Business Unit of MDS Inc., Concord, CA;
Applera Corporation, Framingham, MA (US);
Abstract
A method for introducing samples through a boundary member partially defining a chamber at an entrance point coaxial to a sampling inlet of a mass spectrometer is described. Field-free conditions can be established in at least one region of the chamber. The sample can be introduced adjacent to the sampling inlet, and introducing at least a second sample can be introduced through at least one other entrance point in the chamber not adjacent to the sampling inlet. An apparatus having a sampling inlet and a boundary member partially defining a chamber is also described. Field-free conditions can be established in at least one region of the chamber, and there can be a first aperture in the boundary member through which a source emits sample. Related devices, uses and mass spectrometers are also described.