The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Jan. 08, 2009
Dug Young Kim, Gwangju, KR;
Ji Yong Lee, Gwangju, KR;
Dug Young Kim, Gwangju, KR;
Ji Yong Lee, Gwangju, KR;
Gwangju Institute of Science and Technology, Gwangju, KR;
Abstract
An optical phase microscope using rotating-¼ wavelength plate with pinhole in the center position and Fourier transformed lens is provided. The optical phase microscope comprises an optical image generator that acquires images for a specimen to be observed, an object plane onto which light beams of the images acquired from the optical image generator are projected, a first transform lens that performs primary Fourier transformation on the light beams passing through the object plane, a ¼ wavelength plate with pinhole at the center position that is positioned to be spaced by a focal distance of the first transform lens from the first transform lens, a secondary transform lens that performs secondary Fourier transformation on the light beams passing through the ¼ wavelength plate, and a phase image generator including a photo detector on which the images of the light beams subjected to the secondary Fourier transformation is focused.