The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7678669 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 16, 2010

Filed:

Aug. 14, 2008
Applicants:

Toru Yoshie, Tokyo, JP;

Kenji Komori, Miyazaki, JP;

Inventors:

Toru Yoshie, Tokyo, JP;

Kenji Komori, Miyazaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method for manufacturing a semiconductor substrate in which a semiconductor wafer, formed of a material less likely to increase the hole diameter, is processed to a semiconductor substrate actually applicable to an existing manufacture line. An SiC waferis temporarily fixed to a Si waferthrough a wax. The SiC wafertemporarily fixed to the Si waferis overlapped with a Si waferhaving the same hole diameter as the Si waferthrough an SOG filmP. Orientation flatsA andA are aligned, and while the Si wafersandare overlapped with each other, heating is performed under pressure to solidify the SOG filmP, whereby an SOG solidified filmS is formed. With the aid of the SOG solidified filmS, the SiC waferis adhered to the Si wafer. The SiC waferis adhered at a predetermined position of the Si waferfacing the SiC waferso as to be transferred from the Si waferto the Si wafer. The unneeded Si waferis detached, and the waxis then removed.


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