The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7678512 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 16, 2010

Filed:

Jan. 24, 2007
Applicants:

Yoshi Ono, Camas, WA (US);

Bruce D. Ulrich, Beaverton, OR (US);

Wei Gao, Vancouver, WA (US);

Inventors:

Yoshi Ono, Camas, WA (US);

Bruce D. Ulrich, Beaverton, OR (US);

Wei Gao, Vancouver, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of fabricating a grayscale reticle includes preparing a quartz wafer substrate; depositing a layer of SRO on the top surface of the quartz substrate; patterning and etching the SRO to form an initial microlens pattern using step-over lithography; patterning and etching the SRO to form a recessed pattern in the SRO; depositing an opaque film on the SRO; patterning and etching the opaque film; depositing and planarizing a planarizing layer; cutting the quartz wafer into rectangular pieces sized to be smaller than a selected blank reticle; bonding the a piece a to selected reticle blank to form a grayscale reticle; and using the grayscale reticle to form a microlens array on a photoimager.


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Ono, Yoshi. (2010). Method of making a grayscale reticle using step-over lithography for shaping microlenses (U.S. Patent No. 7678512). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7678512

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