The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2010

Filed:

Aug. 31, 2006
Applicant:

Ron E. Beselt, Burnaby, CA;

Inventor:

Ron E. Beselt, Burnaby, CA;

Assignee:

Honeywell ASCA, Inc., Mississagua, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21F 7/06 (2006.01); G01N 33/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a machine direction measurement system having an increased cross direction sampling area (significantly larger than the natural sensor measurement window) to generate a more representative and stable machine direction reading of the process. In effect, the sensor should have as wide a coverage area as possible without having to resort to the expense of measuring the entire width of the sheet.


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