The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Nov. 15, 2007
Toshifumi Mihashi, Tokyo, JP;
Yoko Hirohara, Tokyo, JP;
Takashi Fujikado, Osaka, JP;
Naoyuki Maeda, Osaka, JP;
Toshifumi Mihashi, Tokyo, JP;
Yoko Hirohara, Tokyo, JP;
Takashi Fujikado, Osaka, JP;
Naoyuki Maeda, Osaka, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
Scattering can be measured by using an optical system having a Hartman-Shack wave-surface sensor. An eye optical characteristic measuring instrument comprises a light source unitfor emitting a light beam of a wavelength in the near-infrared region, an illumination optical systemfor illuminating a small area of the retinal of an eye to be measured with the light beam from the light source unit, a light-receiving optical systemfor receiving a part of the reflected beam of the light beam from the light source unitreflected from the retina through a converting member for converting the part of the reflected light beam into at least substantiallylight beams, a light-receiving sectionfor receiving the received light beam directed by the light-receiving optical systemand generating a signal, and a calculating unit for determining the wavefront aberration of the light beam entering the light-receiving optical systemand the degree of scattering of the received light beam on the basis of the signal from the light-receiving section