The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Mar. 21, 2007
Yoko Hirohara, Tokyo, JP;
Toshifumi Mihashi, Tokyo, JP;
Yoko Hirohara, Tokyo, JP;
Toshifumi Mihashi, Tokyo, JP;
Kabuhsiki Kaisha Topcon, Tokyo, JP;
Abstract
A subject is placed in a more natural state or is encouraged to blink at specified intervals to obtain a measurement result under a fixed condition, and the judgment of the degree of dry eye is facilitated. A measurement part obtains, based on a reflected light flux from a subject eye, optical characteristic data of a two-dimensional vector form representing the time course of each optical characteristic of the subject eye in an blink interval from a certain blink to a next blink with respect to the first to the nth blink intervals. An analysis part one-dimensionally arranges each of the optical characteristic data with respect to the first to the nth blink intervals measured by the measurement part, and arranges the one-dimensional arrangement of the optical characteristic in a p-th blink interval at a p column to create a two-dimensional array, and performs a principal component analysis processing on the two-dimensional array.