The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Sep. 02, 2008
Kazunari Shimizu, Gamagori, JP;
Kenji Nakamura, Toyohashi, JP;
Kazunari Shimizu, Gamagori, JP;
Kenji Nakamura, Toyohashi, JP;
Nidek, Co., Ltd., Gamagori-shi, JP;
Abstract
An eye refractive power measurement apparatus capable of performing analysis of an examinee's eye for irregular astigmatism with accuracy comprises a measurement optical system comprising an optical system projecting measurement light onto an examinee's fundus and an optical system photo-receiving the measurement light as a ring or substantially-ring fundus reflection image, a light deflection member placed in the optical systems, a unit rotating the deflection member, a memory storing the photo-received image as a measurement image, an analysis unit performing analysis of the measurement image, and an output unit, wherein the analysis unit detects the number of images or a width of an image in each meridian direction in the measurement image and judges the eye has irregular astigmatism when a portion in which the number of the images is two or a portion in which the width of the image goes beyond a predetermined level is detected.