The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Aug. 07, 2006
Shigetaka Akiyama, Shizuoka, JP;
Shinichi Tanaka, Shizuoka, JP;
Takanobu Akiyama, Shizuoka, JP;
Katsunobu Ueda, Kanagawa, JP;
Yasuyuki Kita, Nagasaki, JP;
Shigetaka Akiyama, Shizuoka, JP;
Shinichi Tanaka, Shizuoka, JP;
Takanobu Akiyama, Shizuoka, JP;
Katsunobu Ueda, Kanagawa, JP;
Yasuyuki Kita, Nagasaki, JP;
Toshiba Kikai Kabushiki Kaisha, Tokyo, JP;
Abstract
In an apparatus for measuring shapes of both sides of a plate, a measuring apparatus body includes a reference plane of a longitudinal surface plate disposed in an almost vertical state at one end on a metallic bed, a holding mechanism for holding a plate to be measured in almost parallel therewith, and a displacement gauge scanning column. The displacement gauge scanning column includes a first air slide for mounting a first (second) displacement gauge and a second air slide for mounting a third displacement gauge, and is moved in a horizontal axis direction along a pair of V grooves. Moreover, the first (second) air slide is moved in a vertical axis direction. A shape of one of plate surfaces of the plate to be measured is measured by the scan of the first (second) displacement gauge, and at the same time, a shape of the other surface of the plate surface is measured by the scan of the third displacement gauge.