The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2010

Filed:

Dec. 14, 2005
Applicants:

Shunichi Wakamatsu, Sayama, JP;

Mitsuaki Koyama, Sayama, JP;

Tsuyoshi Shiobara, Sayama, JP;

Inventors:

Shunichi Wakamatsu, Sayama, JP;

Mitsuaki Koyama, Sayama, JP;

Tsuyoshi Shiobara, Sayama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/028 (2006.01); G01N 29/032 (2006.01); G01N 29/036 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a Angevin type quartz sensor which is high in measurement sensitivity, suppresses the influence of the surface tension of a sample solution during measurement, and enables an installed quartz resonator to stable oscillate. An opposing surface portion opposes one surface side of the quartz resonator via a housing area and a pouring opening formed in the outside area of the opposing surface portion. Measurement is conducted in a standstill state where the sample solution is filled in the lower side of the opposing surface portion. Since stress due to the surface tension of the sample solution does not act in this state, the quartz resonator can oscillate with reliability. Therefore, the quartz sensor can reduced the thickness of the quartz resonator, which realizes highly sensitive and highly accurate measurement.


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