The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2010

Filed:

Feb. 20, 2009
Applicants:

John Y. S. Kim, Chicago, IL (US);

Young J. Son, Deerfield, IL (US);

Inventors:

John Y. S. Kim, Chicago, IL (US);

Young J. Son, Deerfield, IL (US);

Assignee:

Eidosmed LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/107 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus are provided for measuring the depth of a hole with a first edge and a second edge, comprising positioning a distal end of a first member of a measuring instrument against a first surface in which the first edge is formed. Then, positioning a distal end of a second member against a second surface in which the second edge is formed, the first member and the second member being movably connected; and finally, measuring an electronic signal that represents the distance between the first member and the second member.


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