The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7676711 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 09, 2010

Filed:

Jun. 28, 2007
Applicant:

Hong-sok Choi, Kyoungki-do, KR;

Inventor:

Hong-Sok Choi, Kyoungki-do, KR;

Assignee:

Hynix Semiconductor, Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test circuit for testing a command signal at a package level in a semiconductor device includes: a logic level determining unit for determining logic levels of a plurality of command flag signals in response to a plurality of internal command signals in a test mode; a storage unit for storing the plurality of command flag signals in response to a store control signal and outputting the plurality of command flag signals in series in response to an output control signal; and an output unit for driving an output signal of the storage unit to a data pad.


Find Patent Forward Citations

Choi, Hong-Sok. (2010). Test circuit for testing command signal at package level in semiconductor device (U.S. Patent No. 7676711). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7676711

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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