The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2010

Filed:

Jan. 16, 2007
Applicants:

Koki Uwatoko, Kanagawa, JP;

Kaoru Yasukawa, Kanagawa, JP;

Tetsuichi Satonaga, Kanagawa, JP;

Inventors:

Koki Uwatoko, Kanagawa, JP;

Kaoru Yasukawa, Kanagawa, JP;

Tetsuichi Satonaga, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A failure diagnosis system includes a first database, a second database, an observation-information acquiring unit, a determination-probability calculating unit and an occurrence-probability calculating unit. A first cause-and-effect network stored in the first database stochastically represents a relationship between failure-type candidates and first observation information, which have cause-and-effect relationships with the failure-type candidates. Each second cause-and-effect network stored in the second database stochastically represents relationships between second observation information and failure-cause candidates. The observation-information acquiring unit acquires the first and second observation information from a diagnosed system. The determination-probability calculating unit calculates a determination probability of each failure-type candidate based on the first observation information and the first cause-and-effect network. The occurrence-probability calculating unit calculates occurrence probabilities of the failure-cause candidates for each failure-type candidate based on the second observation information and the second cause-and-effect networks.


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