The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2010

Filed:

Apr. 20, 2007
Applicants:

Anja Klein, Dresden, DE;

Hong-hai DO, Dresden, DE;

Gregor Hackenbroich, Dresden, DE;

Juergen Anke, Dresden, DE;

Inventors:

Anja Klein, Dresden, DE;

Hong-Hai Do, Dresden, DE;

Gregor Hackenbroich, Dresden, DE;

Juergen Anke, Dresden, DE;

Assignee:

SAP AG, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system are described for managing data quality. An example method may include obtaining a first data stream interval including a first group of data items and a first aggregated data quality value associated with a quality of obtaining the first group, each data item including data attribute values, each data quality item including data quality attribute values associated with one of the data items. The first aggregated data quality value, a first indicator associating the first aggregated data quality value with the first group, and the first group may be selected. The first group and the first indicator may be stored in a user table of a database. A data quality table associated with the user table may be determined based on an entry in a system table. The first aggregated data quality value and the first indicator may be stored in the data quality table.


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