The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2010

Filed:

Aug. 25, 2004
Applicants:

Henricus Johannes Maria Meijer, Mercer Island, WA (US);

Yan V. Leshinsky, Bellevue, WA (US);

Arpan A. Desai, Bothell, WA (US);

Andrew E. Kimball, Sammamish, WA (US);

Inventors:

Henricus Johannes Maria Meijer, Mercer Island, WA (US);

Yan V. Leshinsky, Bellevue, WA (US);

Arpan A. Desai, Bothell, WA (US);

Andrew E. Kimball, Sammamish, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The subject invention pertains to a system and method of incorporating collation information into data types. In particular, the subject invention provides for parameterizing data types with collation information such that a comparison between two different collations generates a static-type error rather than a run-time error. Additionally, the invention affords for conveniently working with localized data types to allow generic parameterization over collations as well as ordinary types. In the context of strings, the present invention enables concurrent use of strings in multiple languages and facilitates the correct handling thereof.


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