The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
Dec. 13, 2007
Kenichi Akao, Hachioji, JP;
Seiichi Kashiwabara, Hachioji, JP;
Toshiyuki Nagoshi, Hachioji, JP;
JASCO Corporation, Hachioji-shi, Tokyo, JP;
Abstract
An irreversible-reaction measurement method comprising: a step in which a perturbation is applied to one of the divided portions of a measurement sample placed in a light path of a Fourier-transform spectrophotometer to cause an irreversible-reaction while a mirror of the spectrophotometer remains at a data point; a step in which interferogram is detected from the sample portion placed in the path at predetermined time intervals after the application of the perturbation; a step in which the mirror moves to and remains at the next data point after the reaction of the sample portion reaches an end point; a step in which the sample portion placed in the light path is changed to the next sample portion each time the mirror moves to the next data point; and a step in which the irreversible-reaction of the measurement sample is analyzed in accordance with the interferogram obtained by repeating the steps.