The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
Apr. 22, 2005
Ursula Garczarek, Benediktbeuern, DE;
Pavel Kubalec, Feldafing, DE;
Wolfgang Hösel, Tutzing, DE;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Abstract
The invention provides a method for grouping measurement data obtained by effecting two or more techniques to provide characterization data characterizing at least one sample with respect to characterizing substances. According to one aspect of the invention, the grouping is effected on the basis of at least one statistical distribution of deviations (Δm/z) of a respective characterizing measurement value. According to another aspect of the invention, the grouping is effected on the basis of at least one collective characteristic of a plurality of respective quantitative measurement values (I).