The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
May. 17, 2006
Michael G. Neff, Lake St. Louis, MO (US);
Shirley N. Cheng, Richmond Heights, MO (US);
Chang-shaung R. Lee, Town and Country, MO (US);
Ted L. Johnson, Florissant, MO (US);
Michael G. Neff, Lake St. Louis, MO (US);
Shirley N. Cheng, Richmond Heights, MO (US);
Chang-Shaung R. Lee, Town and Country, MO (US);
Ted L. Johnson, Florissant, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
Sensor scan planner methods and systems are described. In an embodiment, a sensor scan schedule can be generated by a sensor scan schedule generator to optimize the scan schedules of multiple sensors based on optimal capabilities of each sensor and autonomous target recognition algorithm processing. A search manager can then assign an evaluation criteria value to the generated sensor scan schedule based on sensor scan schedule evaluation criteria, and compare the evaluation criteria value to other evaluation criteria values corresponding to respective previously generated sensor scan schedules to determine an optimal sensor scan schedule. The search manager can then determine whether to generate additional sensor scan schedules and assign additional evaluation criteria values for comparison to determine the optimal sensor scan schedule.