The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2010

Filed:

Jul. 05, 2006
Applicants:

Jonathan Liu, Sugar Land, TX (US);

Lorie K. Bear, Sugar Land, TX (US);

Jerome R. Krebs, Houston, TX (US);

Inventors:

Jonathan Liu, Sugar Land, TX (US);

Lorie K. Bear, Sugar Land, TX (US);

Jerome R. Krebs, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method for reducing instability and increasing computational efficiency in tomographic inversion for velocity model building. A system of tomographic equations is developed for a uniform grid. A non-uniform parameterization is found for which a linear mapping exists between the space of the uniform grid and the space of the non-uniform grid. The matrix that relates velocity to the tomographic data in the non-uniform representation is then given by the matrix product of the corresponding matrix in the uniform grid representation and the mapping matrix. Inversion can then be performed for the non-uniform parameterization on a smaller, more stable matrix.


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