The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
May. 30, 2008
Kaoru Mori, Kawasaki, JP;
Toshikazu Nakamura, Kawasaki, JP;
Jun Ohno, Kawasaki, JP;
Masaki Okuda, Kawasaki, JP;
Kaoru Mori, Kawasaki, JP;
Toshikazu Nakamura, Kawasaki, JP;
Jun Ohno, Kawasaki, JP;
Masaki Okuda, Kawasaki, JP;
Fujitsu Microelectronics Limited, Yokohama, JP;
Abstract
An address switch circuit receives a row address signal supplied to a first address terminal group and a column address signal supplied to a second address terminal group. Further, the address switch circuit receives the row address signal supplied to the second address terminal group and thereafter receives the column address signal supplied to the second address terminal group and supplies the received row address signal and the received column address signal to the row decoder and the column decoder during a second operation mode. The number of semiconductor memories that are tested at once can be increased by executing an operation test of the semiconductor memories in the second operation mode. In addition, it becomes possible to test a semiconductor memory using test assets for other semiconductor memories. Consequently, the test efficiency can be improved, and the test cost can be reduced.