The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2010

Filed:

Apr. 16, 2007
Applicants:

Todd Blalock, Penfield, NY (US);

Christopher Cotton, Honeoye Falls, NY (US);

Inventors:

Todd Blalock, Penfield, NY (US);

Christopher Cotton, Honeoye Falls, NY (US);

Assignee:

ASE Optics, Inc., Rochester, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multiplexing spectrometer measures at least one parameter, such as temperature, pressure or stress. The system multiplexes the outputs of Bragg stack sensors deposited at the distant ends of optical fibers brought in contact or in close proximity to objects. The spectrometer detects the peaks of the optical signals returned from the Bragg stacks and converts them into corresponding values of the parameters of interest. The spectrometer includes an optical system that comprises an entrance slit, a diffraction grating as a light dispersing means. Multiplexing occurs on a two-dimensional solid state matrix photo detector detects and converts the light signals returned from the Bragg stack sensing elements into corresponding electrical signals, and a built-in look-up table to provides the values of the parameters of interest that correspond the spectral characteristics of the returned light signals.


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