The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
Dec. 26, 2007
Yuanjing LI, Beijing, CN;
Bing Feng, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yingxin Wang, Beijing, CN;
Dongmei Yu, Beijing, CN;
Yuanjing Li, Beijing, CN;
Bing Feng, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yingxin Wang, Beijing, CN;
Dongmei Yu, Beijing, CN;
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
A method and an apparatus for measuring terahertz time-domain spectrum, which relate to the field of terahertz time-domain spectrum. The method comprises the steps of: generating a first pulse laser beam from a first femtosecond laser device at a preset repetition frequency to generate THz pulses; generating a second pulse laser beam from a second femtosecond laser device at the repetition frequency; measuring electric field intensities of the THz pulses at respective phase differences between the first pulse laser beam and the second pulse laser beam; and obtaining a THz time-domain spectroscopy by performing Fourier transformation of data representative of the electric field intensities. THz spectrum measured according to the method and apparatus improves spectroscopy resolution and provides a broader detection range.