The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
Jun. 25, 2004
Applicant:
Peter Wengler, Erfurt, DE;
Inventor:
Peter Wengler, Erfurt, DE;
Assignee:
Carl Zeiss Meditec AG, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A device and method for determining the defective vision of an optical system include a controllable optical element. The objective and subjective determination of the correction values are more greatly combined in that a measuring and controlling device forms a control loop with the controllable optical element, and the optical characteristics of the controllable element can be changed manually.
Wengler, Peter. (2010). Device and method for determining the amertopia of an optical system (U.S. Patent No. 7673992). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7673992
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