The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2010

Filed:

Jun. 21, 2005
Applicants:

Tod Heiles, Vancouver, WA (US);

Wayne Michael Richard, San Diego, CA (US);

David W. Kinkley, Vancouver, WA (US);

Inventors:

Tod Heiles, Vancouver, WA (US);

Wayne Michael Richard, San Diego, CA (US);

David W. Kinkley, Vancouver, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 29/38 (2006.01); B41J 2/165 (2006.01); B41J 2/21 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for forming an image with at least one linear array of imaging elements. Defective ones of the imaging elements associated with a particular color are detected. A first defective imaging element compensation operation is performed for portions of the image data that are associated with a first predetermined number or fewer adjacent defective imaging elements. A different second defective imaging element compensation operation is performed for portions of the image data that are associated a second predetermined number or more adjacent defective imaging elements.


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