The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2010

Filed:

Jun. 16, 2006
Applicants:

Rudy C. Boynton, San Jose, CA (US);

Patrick E. Flynn, Gilroy, CA (US);

Paul W. Webb, San Jose, CA (US);

Gary W. Knoth, Morgan Hill, CA (US);

Inventors:

Rudy C. Boynton, San Jose, CA (US);

Patrick E. Flynn, Gilroy, CA (US);

Paul W. Webb, San Jose, CA (US);

Gary W. Knoth, Morgan Hill, CA (US);

Assignee:

Western Digital Technologies, Inc., Lake Forest, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a system and method to monitor and count particles removed from a component. The particle monitoring system includes a jet spray device, a snow generator, a particle collection device, and a particle counter. The jet spray device includes an outlet that is disposed locally relative to the component. The snow generator is operable to generate cleaning snow comprising a stream of ice particles, wherein the cleaning snow is emitted from the outlet of the jet spray device onto the component to cause the ejection of particles from the component. The particle collection device includes a collector that is disposed locally around the component to collect particles ejected from the component. The particle counter is coupled to, and in fluid communication with, the particle collection device. The particle counter is operable to detect and count particles ejected from the component.


Find Patent Forward Citations

Boynton, Rudy. (2010). System and method to monitor particles removed from a component (U.S. Patent No. 7673638). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7673638

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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