The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
Jan. 18, 2007
Applicants:
Jun Matsuda, Hiratsuka, JP;
Tsuyoshi Kitazaki, Hiratsuka, JP;
Naoshi Miyashita, Hiratsuka, JP;
Inventors:
Assignee:
The Yokohama Rubber Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60C 23/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus and method derives a deformation amount of a contact-portion of the tire based on the tire information, the contact-portion being in contact with the ground, and calculates an evaluation value based on the derived deformation amount, and comparing the calculated evaluation value with a reference value to determine whether or not the internal mechanical failure has occurred in the tire.
Matsuda, Jun. (2010). Apparatus and method for detecting an internal mechanical failure occurring in a tire (U.S. Patent No. 7673504). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7673504
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile