The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
Oct. 12, 2006
Carl E. Benvenga, Fort Collins, CO (US);
Carl E. Benvenga, Fort Collins, CO (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A method for diagnosing a degree of interference between a plurality of faults in a system under test, the faults being detected by means of applying a test suite to the system under test, includes: 1) for each of the plurality of faults, and for each of a plurality of test syndromes, where a test syndrome is a pattern of passing and failing tests of the test suite, determining relative frequencies at which particular ones of the faults are coupled with particular ones of the syndromes; and 2) using the relative frequencies at which particular ones of the faults are coupled with particular ones of the syndromes to calculate and display to a user, via a graphical user interface, and for the test suite as a whole, test suite degrees of interference between pairs of the faults. Other embodiments are also disclosed.