The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
Nov. 23, 2005
Li-chun Tu, Taipei, TW;
Chun-yu Lin, Taipei Hsien, TW;
Chao-long Tsai, Hsin-Chu, TW;
Chun-chieh Shih, Hsin-Chu Hsien, TW;
Li-Chun Tu, Taipei, TW;
Chun-Yu Lin, Taipei Hsien, TW;
Chao-Long Tsai, Hsin-Chu, TW;
Chun-Chieh Shih, Hsin-Chu Hsien, TW;
MediaTek Inc., Hsin-Chu Hsien, TW;
Abstract
A testing system includes an integrated circuit having an analog design under test and a processor; an digital-to-analog converter (DAC), coupled to the analog design under test and the processor, for converting a digital testing sequence output of the processor into an analog testing sequence fed into the analog design under test; a analog-to-digital converter (ADC), coupled to the analog design under test and the processor, for converting an analog testing response of the analog design under test into a digital testing response fed into the processor; and an external tester, coupled to the processor of the integrated circuit, for sequentially outputting a program sequence to the processor; wherein the processor executes the program sequence without un-predictable conditional jump to get a testing result of the testing system and then outputs the testing result to the external tester.