The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2010

Filed:

Nov. 14, 2006
Applicants:

Mark Jacob Addleman, San Francisco, CA (US);

David Isaiah Seidman, San Francisco, CA (US);

John B. Bley, Durham, NC (US);

Carl Seglem, San Francisco, CA (US);

Inventors:

Mark Jacob Addleman, San Francisco, CA (US);

David Isaiah Seidman, San Francisco, CA (US);

John B. Bley, Durham, NC (US);

Carl Seglem, San Francisco, CA (US);

Assignee:

Computer Associates Think, Inc., Islandia, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Deviation of an expected error rate for a backend server invoked by an application to process a request is used to characterize the backend server health. Performance data generated in response to monitoring application execution is processed to select backend error rate data. The selected data is processed to predict future values of a time series associated with backend error rates. The predicted error rate values are compared to actual error rate values in the time series to determine a deviation from the predicted value. Deviation information for the time series data of error rates is then reported to a user through an interface in a simplified manner.


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