The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
Jun. 17, 2005
Guoxian Xiao, Troy, MI (US);
Pulak Bandyopadhyay, Rochester Hills, MI (US);
Ram Dwibhashyam, Lake Orion, MI (US);
Basel Q. Shadid, St. Catherines, CA;
Jorge F. Arinez, Bloomfield Hills, MI (US);
Leandro G. Barajas, Rochester Hills, MI (US);
Guoxian Xiao, Troy, MI (US);
Pulak Bandyopadhyay, Rochester Hills, MI (US);
Ram Dwibhashyam, Lake Orion, MI (US);
Basel Q. Shadid, St. Catherines, CA;
Jorge F. Arinez, Bloomfield Hills, MI (US);
Leandro G. Barajas, Rochester Hills, MI (US);
GM Global Technology Operations, Inc., Detroit, MI (US);
Abstract
Disclosed herein are a system, method and apparatus for reporting, making alerts and predicting fault codes generated by machines in a line. Historical fault code data is received and filtered according to particular criteria to generate filtered fault code data. Classification of the filtered fault code data into physical groups and into logical groups is followed by sorting the groups to produce fault trend data. Processing the fault trend data with a plurality of analyzers generates output including reports, alerts, and predictions of future fault code occurrences.