The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
Mar. 06, 2006
Jonathan W. Arenberg, Santa Monica, CA (US);
Amy S. Lo, Redondo Beach, CA (US);
Jonathan W. Arenberg, Santa Monica, CA (US);
Amy S. Lo, Redondo Beach, CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
Chromatic correction of a Fresnel lens is effected by collecting data at multiple detectors arrayed along the optical axis of the lens and then digitally processing data from each detector to obtain multiple sets of image data corresponding to selected tuned wavelengths associated with the multiple detectors, or to obtain composite multi-color image data. Digital processing includes deconvolving data from each detector with a point spread function (PSF) associated with the tuned wavelength of the detector, and thereby enhancing the image derived from the detector. Two possible techniques are also disclosed for deriving sub-band signal data having a wavelength that falls between the tuned wavelengths of adjacent detectors.