The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2010

Filed:

Jun. 14, 2005
Applicants:

Takahito Ono, Miyagi, JP;

Takanori Maeda, Saitama, JP;

Atsushi Onoe, Saitama, JP;

Hirokazu Takahashi, Saitama, JP;

Inventors:

Takahito Ono, Miyagi, JP;

Takanori Maeda, Saitama, JP;

Atsushi Onoe, Saitama, JP;

Hirokazu Takahashi, Saitama, JP;

Assignee:

Pioneer Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe () is provided with: a substrate () having a surface facing a medium (); and a point electrode (), formed in the substrate, for performing at least one of detection operation of a state of a domain of the medium and change operation of the state of the domain of the medium, a tip portion, which is an edge portion on a side facing the medium, out of the point electrode being disposed in one point in a plane which is formed in a vicinity of an area portion in which the point electrode is formed by the surface.


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