The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
Sep. 26, 2003
Yong Cheol Park, Gwachon-si, KR;
Sung Dae Kim, Gunpo-si, KR;
Yong Cheol Park, Gwachon-si, KR;
Sung Dae Kim, Gunpo-si, KR;
LG Electronics Inc., Seoul, KR;
Abstract
A method and apparatus for managing a defective area on a optical recording medium, e.g., of writable once type, permits more efficient writing and management of defect list information or temporary defect list information for managing the defective area in a minimum recording size. The method includes writing data in a defective area existing on a high density optical disc, e.g., such as a BD-WO, in a spare area in place of the defective area, producing defect list information for access to the data replacement written in the spare area and writing in a particular area for defect management. The defect entries actually corresponding to the replacement written data, and writing location information of the next available spare area are written and managed as defect list information for management, or the writing location information of a location where replacement writing is possible is written and managed as defect definition structure information.