The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2010

Filed:

Mar. 27, 2007
Applicants:

Takayasu Kanaya, Chuo-ku, JP;

Katsuki Kurihara, Chuo-ku, JP;

Tetsuya Kuwashima, Chuo-ku, JP;

Inventors:

Takayasu Kanaya, Chuo-ku, JP;

Katsuki Kurihara, Chuo-ku, JP;

Tetsuya Kuwashima, Chuo-ku, JP;

Assignee:

TDK Corporation, Nihonbashi, Chuo-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/39 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an MR effect element in which the magnetization of the pinned layer is stably fixed even after going through high temperature process. The MR effect element comprises: a non-magnetic intermediate layer; a pinned layer and a free layer stacked so as to sandwich the non-magnetic intermediate layer; an antiferromagnetic layer stacked to have a surface contact with the pinned layer, for fixing a magnetization of the pinned layer to a direction in-plane of the pinned layer and perpendicular to a track width direction; and hard bias layers provided on both sides in the track width direction of the free layer, for applying a bias field to the free layer, a product λ×σ of a saturation magnetostriction constant λof the pinned layer and an internal stress σ on a cross-section perpendicular to a layer surface of the hard bias layer being negative.


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