The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2010

Filed:

Jul. 14, 2006
Applicants:

Daisuke Shibata, Akita, JP;

Takayuki Nakaya, Tokyo, JP;

Hidetoshi Takeda, Saitama, JP;

Yoshihito Hatazawa, Akita, JP;

Toshiro Kotaki, Tokyo, JP;

Inventors:

Daisuke Shibata, Akita, JP;

Takayuki Nakaya, Tokyo, JP;

Hidetoshi Takeda, Saitama, JP;

Yoshihito Hatazawa, Akita, JP;

Toshiro Kotaki, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A refractive index controlled diffractive optical element having a two-dimensional refractive index distribution to be written on a transparent material, wherein a first refractive index region with a refractive index nand width dis formed in a transparent material, and the ith refractive index region with a refractive index n(assuming n≠n) and a width dis formed adjacent to the (i−1)th refractive index region and opposite to the (i −2)th refractive index region (at an arbitrary side of the (i−1)th refractive index region when i=2) where i is an integer within a range of 2≦i≦x. Accordingly, a diffractive optical element simultaneously having high diffraction efficiency to a particular order and thinness of the element itself can be obtained.


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