The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2010

Filed:

Oct. 28, 2005
Applicants:

Peter Ehbets, Zürich, CH;

Adrian Kohlbrenner, Thalwil, CH;

Beat Frick, Buchs, CH;

Inventors:

Peter Ehbets, Zürich, CH;

Adrian Kohlbrenner, Thalwil, CH;

Beat Frick, Buchs, CH;

Assignee:

X-Rite Europe GmbH, Regensdorf, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

The measuring device comprises a lighting system, a photoelectric receiver unit and optical means. The lighting system applies light to image elements disposed in strip-shaped lighting regions () at a standardized angle of incidence range. The photoelectric receiver unit comprises several photoelectric line sensors () disposed parallel at a distance apart which are sensitized to different wavelength ranges by color filters () connected upstream. The optical means comprise linear optical arrays () which pick up the measurement light reflected by the image elements at a standardized range of angle of reflection and direct it to one of the respective line sensors (). By means of optical screening and other structural features, cross-talk effects between adjacent image elements are largely reduced.


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