The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2010

Filed:

Sep. 29, 2005
Applicants:

Beat Aebischer, Heerbrugg, CH;

Marcel Rohner, Heiden, CH;

Inventors:

Beat Aebischer, Heerbrugg, CH;

Marcel Rohner, Heiden, CH;

Assignee:

Leica Geosystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an electro-optical distance measuring method wherein frequency-modulated optical radiation is emitted onto at least one target to be measured. Once the radiation back-scattered to the target is received, the chirp of radiation is modeled by means of a phase function Φ(t) having parameters c, thereby making description of the deviation of the chirp from the linear profile possible. The parameters used for description are at least partially determined from measurements or are coestimated during numerical signal processing.


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