The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
Apr. 21, 2006
Rob Cook, San Anselmo, CA (US);
Tony Derose, San Rafael, CA (US);
Rob Cook, San Anselmo, CA (US);
Tony DeRose, San Rafael, CA (US);
Pixar, Emeryville, CA (US);
Abstract
Data tiles can be combined to form attribute data sets for use in generating computer graphics images. Tiles may be arranged in a regular grid pattern or in arbitrary, irregular positions. Tiles can be overlapped slightly and blended to hide tile boundaries. The value of the combined data set in an overlap region may be a weighted sum of values from the tiles. To compensate for reduced variance and contrast caused by blending, the values in overlap regions can be scaled by a variance correction factor. The variance correction factor is the inverse of the reduction in variance from the source tiles. Tile values can be scaled by their weights and variance correction values at the time they are combined or in advance, if the pattern of tile overlaps are consistent. Data tiles can be comprised of bandlimited noise data or other data types.