The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
May. 22, 2006
Sung-jae Jung, Seoul, KR;
Sang-yoon Jeon, Seoul, KR;
Sung-jae Jung, Seoul, KR;
Sang-yoon Jeon, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Provided are an IC and a method for automatically tuning process and temperature variations. The IC includes: a test circuit unit including test circuit elements having identical element values and variations to a tuning-targeted circuit element and at least one reference circuit element having a smaller variation than the tuning-targeted circuit element; a comparator that obtains a difference between intensities of first and second signals detected from the test circuit unit; and a tuning unit that tunes the variation of the tuning-targeted circuit element according to the difference between the intensities of the first and second signals. Thus, process and temperature variations of a circuit element can be detected and accurately tuned with respect to the circuit element itself. Also, the process and temperature variations can be tuned inside an IC. Thus, the time required for tuning the process and temperature variations can be reduced.