The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
Jan. 17, 2008
Daniel B Gunyan, Santa Rosa, CA (US);
David E Root, Santa Rosa, CA (US);
Loren C Betts, Santa Rosa, CA (US);
Jason M Horn, Santa Rosa, CA (US);
Daniel B Gunyan, Santa Rosa, CA (US);
David E Root, Santa Rosa, CA (US);
Loren C Betts, Santa Rosa, CA (US);
Jason M Horn, Santa Rosa, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define 'large-signal S-parameters') with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.