The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
Dec. 25, 2006
Kengo Shibuya, Chiba, JP;
Tomoaki Tsuda, Uji, JP;
Fumihiko Nishikido, Chiba, JP;
Naoko Inadama, Chiba, JP;
Eiji Yoshida, Chiba, JP;
Taiga Yamaya, Chiba, JP;
Hideo Murayama, Chiba, JP;
Kengo Shibuya, Chiba, JP;
Tomoaki Tsuda, Uji, JP;
Fumihiko Nishikido, Chiba, JP;
Naoko Inadama, Chiba, JP;
Eiji Yoshida, Chiba, JP;
Taiga Yamaya, Chiba, JP;
Hideo Murayama, Chiba, JP;
National Institute of Radiological Sciences, Chiba, JP;
Abstract
A positron emission tomography (PET) scanner is provided which uses information on the time-of-flight difference (TOF) between annihilation radiations for image reconstruction. The scanner has detection time correction information (memory) corresponding to information on coordinates in a radiation detection element (e.g., scintillator crystal), in the depth and lateral directions, at which an interaction has occurred between an annihilation radiation and the crystal. Reference is made to the detection time correction information, thereby providing information on time-of-flight difference with improved accuracy. As such, an improved signal to noise ratio and spatial resolution are provided for image reconstruction using time-of-flight (TOF) difference.