The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
Oct. 29, 2007
Applicants:
Mark E. Gardiner, Santa Rosa, CA (US);
Jeffrey E. Clements, Oakdale, MN (US);
Mark R. Dupre, Oakdale, MN (US);
Inventors:
Mark E. Gardiner, Santa Rosa, CA (US);
Jeffrey E. Clements, Oakdale, MN (US);
Mark R. Dupre, Oakdale, MN (US);
Assignee:
3M Innovative Properties Company, Saint Paul, MN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A cutting tool assembly having a tool post capable of lateral movement along a work piece to be cut and a shank on the tool post holding at least one machined tool tip and possibly other tool tips. The tool tip has diffractive features in contact with the work piece in order to machine macro-scale features having nano-scale features. The machined work piece can be used to make articles having diffractive features such as optical films having lenslets.