The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
Oct. 20, 2006
Applicants:
Hao Chen, Syracuse, NY (US);
James Michels, Ithaca, NY (US);
Pramod K Varshney, Fayetteville, NY (US);
Inventors:
Hao Chen, Syracuse, NY (US);
James Michels, Ithaca, NY (US);
Pramod K Varshney, Fayetteville, NY (US);
Assignee:
Syracuse University, Syracuse, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
Apparatus and method for improving the detection of signals obscured by noise using stochastic resonance noise. The method determines the stochastic resonance noise probability density function in non-linear processing applications that is added to the observed data for optimal detection with no increase in probability of false alarm. The present invention has radar, sonar, signal processing (audio, image and video), communications, geophysical, environmental, and biomedical applications.